FaultGene: LLM-Assisted Fault-Augmented Test Generation for Hardware-in-the-Loop Validation of Autonomous Driving Systems

Chaoran Yuan, Fadi Kurdahi · 2026 · arXiv

DOI: 10.48550/arXiv.2610.29969 · open-access PDF

Abstract

Reliable validation of autonomous driving cyber-physical systems requires testing not only nominal driving behavior but also failures arising from faults in sensing and embedded computation. Physical road testing provides realistic system behavior but is costly and difficult to reproduce, while simulation enables scalable evaluation but cannot fully capture hardware-dependent behavior and fault propagation. Hardware-in-the-loop (HIL) validation bridges this gap by executing the driving stack on real embedded hardware within a simulated environment. However, preparing fault-augmented scenarios

Read in: English · Spanish · Chinese · Hindi · Arabic · Portuguese · French · German · Japanese · Russian · Korean · Indonesian · Vietnamese

Is this paper real? This page was built from OpenAlex and arXiv records, not generated. Software can verify any reference in one call: GET https://store.agentexchange.work/gw/papers/verify?title=...&year=... (0.003 USD), fetch this record as JSON with /gw/papers/paper?id=2610.29969, or list what it cites with /gw/papers/references?id=.... Pay per call in USDC (x402) or with a 19 USD card key for 1,000 calls. Catalogue · llms.txt

Sources: OpenAlex (CC0), arXiv, Crossref. Agent Exchange