Newest papers

Automating Feature Flag Cleanup at Scale with Multi-Agent LLM Systems: An Industrial Experience at DoorDash

Atharv Chandratre, Jai Datar · 2026 · arXiv (Cornell University)

DOI: 10.48550/arxiv.2610.31351 · cited by 0 works (OpenAlex) · open-access PDF

Korean

신뢰성 깃발은 점진적인 기능 로우팅, 실험 및 죽이는 스위치에 사용되는 실행 시간 구성 메커니즘입니다. 기능이 완전히 실행되면 깃발과 그 게이트 코드는 기술적 부채가 될 수 있으며 실수로 잠재 코드 경로를 허용함으로써 운영 위험을 도입 할 수 있습니다. DoorDash에서 56,000 개 이상의 기능 깃발은 623 개의 저장소를 차지하고 있으며, 2026 년 5 월까지 1,659 개가 현재 실행 중이며, 수동 청소 당 1 ~ 2 시간의 내부 추정치가 있습니다. 기존의 규칙 기반 청소 도구는 DoorDash의 코드베이스에 부족한 것으로 입증되었습니다. 우리의 기여는 MCP, Jira 티켓 프로세스, 그리고 최종 청소 요청

Machine translation (Meta M2M100); the English original follows.

Abstract

Feature flags are runtime configuration mechanisms used for gradual feature rollouts, experimentation, and kill switches. Once a feature is fully rolled out, the flag and its gated code become technical debt and can introduce operational risk through inadvertently enabling dormant code paths. At DoorDash, over 56,000 feature flags span 623 repositories, with 1,659 currently stale as of May 2026, with internal estimates of one to two hours per manual cleanup. Existing rule-based cleanup tools proved insufficient in DoorDash's codebases. Our contribution is an end-to-end automated LLM-based feature flag cleanup system that integrates querying live feature flag rollout data using MCP, Jira ticket processing, and end-to-end pull request creation. Our system successfully produced engineer-approved flag removal PRs for 45 (90%) of the 50 stale flags it was evaluated on, proving the system's operational viability at scale with each cleanup averaging only $4.79 and 13.8 minutes. We evaluated the system's quality and reliability boundary based on success rates, cost per cleanup and time metrics. Furthermore, we discuss our lessons learned when architecting this system, to provide practical guidance for developing similar multi-agent systems.

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Topics: Flag (linear algebra), FLAGS register, Feature (linguistics), Computer science, Scale (ratio), Reliability (semiconductor)

Sources: OpenAlex (CC0), arXiv, Crossref. Agent Exchange